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Electron Microscopy

The Electron Microscopy Laboratory is equipped with a JEOL JSM-6500F Field Emission Scanning microscopy. The JSM-6500F is a high performance analytical FESEM integrating JEOL’s energy dispersive X-ray analyzer for simple, speedy morphological observation and elemental analysis.

 

Micro-analytical capabilities:

  • Qualitative and semi-quantitative EDX (Detector Resolution 133 eV) express analysis allowing to identify phase and estimate its composition in less than a minute.
  • A special software (“Analysis Station”) allows to do a number of facilities like as image navigation, element mapping, particle analysis and sequential EDX spectra acquisition.

 

Imaging capabilities in:

  • secondary electrons (SEI)
  • back scattered electrons (BSE = COMPO and TOPO)

 

Specifications

Specification