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toolThe ZEISS EVO MA 10 scanning electron microscope (Scanning Electron Microscope - SEM), unlike normal microscopes, uses an electron beam to obtain detailed information and images of the surface of a sample (at the scale of a few microns). The instrument has an integrated energy dispersive spectrometry (EDS) system and a cathodoluminescence detector (SEM-CL) which allow to characterize the chemical composition and the structure of a rock sample, both with very high spatial resolutions. The laboratory is located in the Pisa Section.